ZY

Zengyi Yuan

SC Shanghai Huali Integrated Circuit: 1 patents #48 of 130Top 40%
Overall (All Time): #2,649,691 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
11307151 Method for detecting wafer backside defect Yin Long, Kai-Hsiang Wang 2022-04-19