Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9269639 | Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device | Feijue Liu, Yin Long, Qiliang Ni, Hunglin Chen | 2016-02-23 |
| 8987013 | Method of inspecting misalignment of polysilicon gate | Hunglin Chen, Yin Long, Qiliang Ni | 2015-03-24 |
| 8658438 | Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices | Qiliang Ni, Yin Long, Kai-Hsiang Wang, Hunglin Chen | 2014-02-25 |