Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7060626 | Multi-run selective pattern and etch wafer process | Kenneth Bandy, Mark D. Levy, Sara L. Lucas, Timothy C. Milmore, Matthew Nicholls +1 more | 2006-06-13 |
| 6944578 | Contact hole profile and line edge width metrology for critical image control and feedback of lithographic focus | Reginald R. Bowley, Jr., James Doran, Stephen E. Knight, Robert K. Leidy, Keith J. Machia +2 more | 2005-09-13 |
| 6917901 | Contact hole profile and line edge width metrology for critical image control and feedback of lithographic focus | Reginald R. Bowley, Jr., James Doran, Stephen E. Knight, Robert K. Leidy, Keith J. Machia +2 more | 2005-07-12 |