Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8213705 | Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer | Chien-Huei Chen, Xiaoming Wang, Eugene Shifrin | 2012-07-03 |
| 8139844 | Methods and systems for determining a defect criticality index for defects on wafers | Chien-Huei Chen, Yan Xiong, Jianxin Zhang, Ellis Chang | 2012-03-20 |
| 7894659 | Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer | Chien-Huei Chen, Xiaoming Wang, Eugene Shifrin | 2011-02-22 |
| 5428726 | Triangulation of random and scattered data | Les Piegl | 1995-06-27 |