Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8859195 | Methods of lithographically patterning a substrate | Yoshiki Hishiro, Scott E. Sills, Hiroyuki Mori, Paul D. Shirley, Lijing Gou +1 more | 2014-10-14 |
| 8309297 | Methods of lithographically patterning a substrate | Yoshiki Hishiro, Scott E. Sills, Hiroyuki Mori, Paul D. Shirley, Lijing Gou +1 more | 2012-11-13 |
| 8163468 | Method of reducing photoresist defects during fabrication of a semiconductor device | Yoshiki Hishiro, Lijing Gou, Scott E. Sills, Hiroyuki Mori, Paul D. Shirley +1 more | 2012-04-24 |
| 7271086 | Microfeature workpieces and methods of forming a redistribution layer on microfeature workpieces | Sanh D. Tang, John Lee, Fred Fishburn | 2007-09-18 |
| 7095885 | Method for measuring registration of overlapping material layers of an integrated circuit | Eugene DeLaRosa | 2006-08-22 |