Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6934929 | Method for improving OPC modeling | George E. Bailey | 2005-08-23 |
| 6782525 | Wafer process critical dimension, alignment, and registration analysis simulation tool | Mario Garza, Neal Callan, George E. Bailey, Paul G. Filseth | 2004-08-24 |