Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7173447 | Method and apparatus for diagnosing fault in semiconductor device | Masatsugu Yamashita, Kodo Kawase, Masayoshi Tonouchi, Kiyoshi Nikawa | 2007-02-06 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7173447 | Method and apparatus for diagnosing fault in semiconductor device | Masatsugu Yamashita, Kodo Kawase, Masayoshi Tonouchi, Kiyoshi Nikawa | 2007-02-06 |