Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8410787 | Testing of an integrated circuit with a plurality of clock domains | Richard Morren | 2013-04-02 |
| 7620866 | Test access architecture and method of testing a module in an electronic circuit | Erik Jan Marinissen | 2009-11-17 |
| 7571068 | Module, electronic device and evaluation tool | — | 2009-08-04 |
| 7409612 | Testing of integrated circuits | Leon Maria Albertus Van De Logt, Frank Van Der Heyden | 2008-08-05 |
| 7124340 | Low pin count, high-speed boundary scan testing | Gerardus A. A. Bos, Hendrikus Petrus Elisabeth Vranken, David Lelouvier, Herve Fleury | 2006-10-17 |
| 6988230 | Test arrangement for assemblages of intergrated circuit blocks | Hubertus Gerardus Hendrikus Vermeulen, Guillaume E. A. Lousberg | 2006-01-17 |