Issued Patents All Time
Showing 25 most recent of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11169029 | Coaxial fiber optical pyrometer with laser sample heater | Gregory A. Magel | 2021-11-09 |
| 10176963 | Method and apparatus for alignment of optical and charged-particle beams in an electron microscope | Gregory A. Magel | 2019-01-08 |
| RE46350 | Method for stem sample inspection in a charged particle beam instrument | Lyudmila Zaykova-Feldman, Gonzalo Amador, Matthew Hammer | 2017-03-28 |
| 8759765 | Method for processing samples held by a nanomanipulator | Cheryl Hartfield, Brian P. Miller | 2014-06-24 |
| 8512474 | Apparatus for precursor delivery system for irradiation beam instruments | Rocky Kruger, Aaron C. Smith | 2013-08-20 |
| 8440969 | Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images | Cheryl Hartfield, Gregory A. Magel | 2013-05-14 |
| 8394454 | Method and apparatus for precursor delivery system for irradiation beam instruments | Rocky Kruger, Aaron C. Smith | 2013-03-12 |
| 8247768 | Method for stem sample inspection in a charged particle beam instrument | Lyudmila Zaykova-Feldman, Gonzalo Amador, Matthew Hammer | 2012-08-21 |
| 8227781 | Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument | Lyudmila Zaykova-Feldman, Gonzalo Amador | 2012-07-24 |
| 8168949 | Method for stem sample inspection in a charged particle beam instrument | Lyudmila Zaykova-Feldman, Gonzalo Amador, Matthew Hammer | 2012-05-01 |
| 7961397 | Single-channel optical processing system for energetic-beam microscopes | Herschel M. Marchman, Rocky Kruger | 2011-06-14 |
| 7935937 | Method of forming TEM sample holder | Gonzalo Amador, Lyudmila Zaykova-Feldman | 2011-05-03 |
| 7834315 | Method for STEM sample inspection in a charged particle beam instrument | Lyudmila Zaykova-Feldman, Gonzalo Amador, Matthew Hammer | 2010-11-16 |
| 7785233 | Collapsible hurdle with quick reset | — | 2010-08-31 |
| 7755372 | Method for automated stress testing of flip-chip packages | Lyudmila Zaykova-Feldman | 2010-07-13 |
| 7644637 | Method and apparatus for transfer of samples in a controlled environment | Gonzalo Amador | 2010-01-12 |
| 7446542 | Apparatus and method for automated stress testing of flip-chip packages | Lyudmila Zaykova-Feldman | 2008-11-04 |
| 7414252 | Method and apparatus for the automated process of in-situ lift-out | Lyudmila Zaykova-Feldman | 2008-08-19 |
| 7395727 | Strain detection for automated nano-manipulation | — | 2008-07-08 |
| 7381971 | Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope | Lyudmilla Zaykova-Feldman | 2008-06-03 |
| 7315023 | Method of preparing a sample for examination in a TEM | — | 2008-01-01 |
| 7208724 | Apparatus and method of detecting probe tip contact with a surface | Lyudmila Zaykova-Feldman | 2007-04-24 |
| 7126132 | Apparatus for preparing a TEM sample holder | — | 2006-10-24 |
| 7126133 | Kit for preparing a tem sample holder | — | 2006-10-24 |
| 7115882 | TEM sample holder | — | 2006-10-03 |