Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE46350 | Method for stem sample inspection in a charged particle beam instrument | Thomas M. Moore, Gonzalo Amador, Matthew Hammer | 2017-03-28 |
| 8247768 | Method for stem sample inspection in a charged particle beam instrument | Thomas M. Moore, Gonzalo Amador, Matthew Hammer | 2012-08-21 |
| 8227781 | Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument | Thomas M. Moore, Gonzalo Amador | 2012-07-24 |
| 8168949 | Method for stem sample inspection in a charged particle beam instrument | Thomas M. Moore, Gonzalo Amador, Matthew Hammer | 2012-05-01 |
| 7935937 | Method of forming TEM sample holder | Thomas M. Moore, Gonzalo Amador | 2011-05-03 |
| 7834315 | Method for STEM sample inspection in a charged particle beam instrument | Thomas M. Moore, Gonzalo Amador, Matthew Hammer | 2010-11-16 |
| 7755372 | Method for automated stress testing of flip-chip packages | Thomas M. Moore | 2010-07-13 |
| 7446542 | Apparatus and method for automated stress testing of flip-chip packages | Thomas M. Moore | 2008-11-04 |
| 7414252 | Method and apparatus for the automated process of in-situ lift-out | Thomas M. Moore | 2008-08-19 |
| 7208724 | Apparatus and method of detecting probe tip contact with a surface | Thomas M. Moore | 2007-04-24 |