Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12260543 | Machine learning based examination of a semiconductor specimen and training thereof | Tal Ben-Shlomo, Shaul Cohen, Tomer Peled | 2025-03-25 |
| 11915406 | Generating training data usable for examination of a semiconductor specimen | Matan Steiman | 2024-02-27 |
| 11854184 | Determination of defects and/or edge roughness in a specimen based on a reference image | Shaul Cohen, Noam Zac | 2023-12-26 |
| 11631179 | Segmentation of an image of a semiconductor specimen | Elad Ben Baruch, Shaul Cohen, Tal Ben-Shlomo | 2023-04-18 |
| 11449977 | Generating training data usable for examination of a semiconductor specimen | Matan Steiman | 2022-09-20 |
| 11232550 | Generating a training set usable for examination of a semiconductor specimen | Elad Ben Baruch, Shaul Cohen, Tal Ben-Shlomo | 2022-01-25 |
| 11022566 | Examination of a semiconductor specimen | Dror Alumot, Shaul Cohen | 2021-06-01 |