Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7206706 | Inspection method and system using multifrequency phase analysis | Changting Wang, William Stewart McKnight, Ui Suh | 2007-04-17 |
SE
Serkan Ertekin
Overall (All Time): #3,383,463 of 4,157,543Top 85%
1
Patents All Time