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Method and system for measurement of dielectric constant of thin films using a near field microwave probe |
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Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
Hans M. Christen, Vladimir V. Talanov, Andrew R. Schwartz |
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| 6856140 |
System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes |
Vladimir V. Talanov, Andrew R. Schwartz, Hans M. Christen |
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Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
Hans M. Christen, Vladimir V. Talanov, Andrew R. Schwartz |
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| 6597185 |
Apparatus for localized measurements of complex permittivity of a material |
Vladimir V. Talanov, Hans M. Christen |
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