AS

Andre Scherz

Becton, Dickinson And: 2 patents #1,271 of 2,926Top 45%
SM Solid State Measurements: 2 patents #4 of 19Top 25%
Overall (All Time): #1,183,737 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
9931644 System and method for automated sample preparation Kevin Bailey, Christopher Embres, Donald E. Gorelick, Timothy Roy Hansen, Dwight Livingston +4 more 2018-04-03
9381524 System and method for automated sample preparation Kevin Bailey, Christopher Embres, Donald E. Gorelick, Timothy Roy Hansen, Dwight Livingston +4 more 2016-07-05
7362108 Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe Vladimir V. Talanov, Andrew R. Schwartz 2008-04-22
7285963 Method and system for measurement of dielectric constant of thin films using a near field microwave probe Vladimir V. Talanov, Andrew R. Schwartz, Robert Moreland 2007-10-23