Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11742326 | Stacked superconducting integrated circuits with three dimensional resonant clock networks | Anna Y. Herr | 2023-08-29 |
| 11417821 | Superconductor ground plane patterning geometries that attract magnetic flux | Anna Y. Herr, Quentin P. Herr | 2022-08-16 |
| 10591952 | Clock distribution resonator system | Joshua A. Strong, Max E. Nielsen, Temitope Olumuyiwa Ogunnika | 2020-03-17 |
| 10236869 | Superconducting transmission driver system | Quentin P. Herr, Edward Rudman, Jonathan D. Egan | 2019-03-19 |
| 9722589 | Clock distribution network for a superconducting integrated circuit | Joshua A. Strong | 2017-08-01 |
| 9529035 | Method and system for localization of open defects in electronic devices with a DC squid based RF magnetometer | Antonio Orozco, Alfred Benjamin Cawthorne, III, Nicholas Eric Gagliolo | 2016-12-27 |
| 9476951 | DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz and higher | Antonio Orozco, Alfred Benjamin Cawthorne, III, Nesco Mario Lettsome, Jr. | 2016-10-25 |
| 7362108 | Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe | Andrew R. Schwartz, Andre Scherz | 2008-04-22 |
| 7285963 | Method and system for measurement of dielectric constant of thin films using a near field microwave probe | Andrew R. Schwartz, Andre Scherz, Robert Moreland | 2007-10-23 |
| 7102363 | Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits | Andrew R. Schwartz | 2006-09-05 |
| 6959481 | Apertured probes for localized measurements of a material's complex permittivity and fabrication method | Robert Moreland, Hans M. Christen, Andrew R. Schwartz | 2005-11-01 |
| 6943562 | Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits | Andrew R. Schwartz | 2005-09-13 |
| 6856140 | System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes | Robert Moreland, Andrew R. Schwartz, Hans M. Christen | 2005-02-15 |
| 6680617 | Apertured probes for localized measurements of a material's complex permittivity and fabrication method | Robert Moreland, Hans M. Christen, Andrew R. Schwartz | 2004-01-20 |
| 6597185 | Apparatus for localized measurements of complex permittivity of a material | Hans M. Christen, Robert Moreland | 2003-07-22 |
| 6366096 | Apparatus and method for measuring of absolute values of penetration depth and surface resistance of metals and superconductors | Steven Mark Anlage | 2002-04-02 |