Andrew R. Schwartz — 7 Patents at Neocera

Andrew R. Schwartz has been granted 7 US patents while listed as an inventor at Neocera. The first was granted in 2004 and the most recent in April 2008. Andrew R. Schwartz ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Andrew R. Schwartz in Bethesda, MD, US.

Patents per Year

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date
7362108	Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe	Vladimir V. Talanov, Andre Scherz	2008-04-22
7285963	Method and system for measurement of dielectric constant of thin films using a near field microwave probe	Vladimir V. Talanov, Andre Scherz, Robert Moreland	2007-10-23
7102363	Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits	Vladimir V. Talanov	2006-09-05
6959481	Apertured probes for localized measurements of a material's complex permittivity and fabrication method	Robert Moreland, Hans M. Christen, Vladimir V. Talanov	2005-11-01
6943562	Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits	Vladimir V. Talanov	2005-09-13
6856140	System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes	Vladimir V. Talanov, Robert Moreland, Hans M. Christen	2005-02-15
6680617	Apertured probes for localized measurements of a material's complex permittivity and fabrication method	Robert Moreland, Hans M. Christen, Vladimir V. Talanov	2004-01-20