Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7362108 | Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe | Vladimir V. Talanov, Andre Scherz | 2008-04-22 |
| 7285963 | Method and system for measurement of dielectric constant of thin films using a near field microwave probe | Vladimir V. Talanov, Andre Scherz, Robert Moreland | 2007-10-23 |
| 7102363 | Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits | Vladimir V. Talanov | 2006-09-05 |
| 6959481 | Apertured probes for localized measurements of a material's complex permittivity and fabrication method | Robert Moreland, Hans M. Christen, Vladimir V. Talanov | 2005-11-01 |
| 6943562 | Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits | Vladimir V. Talanov | 2005-09-13 |
| 6856140 | System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes | Vladimir V. Talanov, Robert Moreland, Hans M. Christen | 2005-02-15 |
| 6680617 | Apertured probes for localized measurements of a material's complex permittivity and fabrication method | Robert Moreland, Hans M. Christen, Vladimir V. Talanov | 2004-01-20 |