Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7623427 | Surface inspection by amplitude modulated specular light detection | Wafaa Abdalla | 2009-11-24 |
| 7554670 | Surface inspection by double pass laser doppler vibrometry | Wafaa Abdalla | 2009-06-30 |
| 6881312 | Ultra high throughput microfluidic analytical systems and methods | Anne R. Kopf-Sill, Andrea W. Chow, Morten Jensen, Michael A. Spaid, Colin B. Kennedy +1 more | 2005-04-19 |
| 6547941 | Ultra high throughput microfluidic analytical systems and methods | Anne R. Kopf-Sill, Andrea W. Chow, Morten Jensen, Michael A. Spaid, Colin B. Kennedy +1 more | 2003-04-15 |
| 6358387 | Ultra high throughput microfluidic analytical systems and methods | Anne R. Kopf-Sill, Andrea W. Chow, Morten Jensen, Michael A. Spaid, Colin B. Kennedy +1 more | 2002-03-19 |
| 5978091 | Laser-bump sensor method and apparatus | Marco A. Krumbuegel, Reginald Lee, Ming M. Yang | 1999-11-02 |
| 5883714 | Method and apparatus for detecting defects on a disk using interferometric analysis on reflected light | George A. Burt, Jr., Joel Libove | 1999-03-16 |
| 5875029 | Apparatus and method for surface inspection by specular interferometric and diffuse light detection | Wayne Li, Igor Iosilevsky, Kenneth H. Womack, Vlastimil Cejna, George A. Burt, Jr. | 1999-02-23 |
| 5719840 | Optical sensor with an elliptical illumination spot | — | 1998-02-17 |
| 5189481 | Particle detector for rough surfaces | Kenneth P. Gross, Armand P. Neukermans | 1993-02-23 |
| 5076692 | Particle detection on a patterned or bare wafer surface | Armand P. Neukermans, Ralph C. Wolf, David A. Wolze, Stanley Stokowski | 1991-12-31 |