Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8124933 | Mapping-projection-type electron beam apparatus for inspecting sample by using electrons emitted from the sample | Kenji Watanabe, Takeshi Murakami, Masahiro Hatakeyama, Yoshinao Hirabayashi, Tohru Satake +2 more | 2012-02-28 |