Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12322659 | Pixel classification of film non-uniformity based on processing of substrate images | Dominic J. Benvegnu | 2025-06-03 |
| 12288724 | Region classification of film non-uniformity based on processing of substrate images | Dominic J. Benvegnu | 2025-04-29 |
| 11776109 | Thickness measurement of substrate using color metrology | Dominic J. Benvegnu, Boguslaw A. Swedek, Martin A. Josefowicz | 2023-10-03 |
| 11315232 | Residue detection using a luminance histogram | Dominic J. Benvegnu | 2022-04-26 |
| 11100628 | Thickness measurement of substrate using color metrology | Dominic J. Benvegnu, Boguslaw A. Swedek, Martin A. Josefowicz | 2021-08-24 |