Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11776109 | Thickness measurement of substrate using color metrology | Nojan Motamedi, Dominic J. Benvegnu, Boguslaw A. Swedek | 2023-10-03 |
| 11100628 | Thickness measurement of substrate using color metrology | Nojan Motamedi, Dominic J. Benvegnu, Boguslaw A. Swedek | 2021-08-24 |