| 7510124 |
Wafer identification mark |
Brian C. Barker, Raymond Bunkofske, John Z. Colt, Jr., Perry G. Hartswick, John Lewis |
2009-03-31 |
| 7007855 |
Wafer identification mark |
Brian C. Barker, Raymond Bunkofske, John Z. Colt, Jr., Perry G. Hartswick, John Lewis |
2006-03-07 |
| 6678569 |
User configurable multivariate time series reduction tool control method |
Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Maheswaran Surendra, Marc A. Taubenblatt +1 more |
2004-01-13 |
| 6584368 |
User configurable multivariate time series reduction tool control method |
Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Maheswaran Surendra, Marc A. Taubenblatt +1 more |
2003-06-24 |
| 6442445 |
User configurable multivariate time series reduction tool control method |
Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Maheswaran Surendra, Marc A. Taubenblatt +1 more |
2002-08-27 |
| 5686345 |
Trench mask for forming deep trenches in a semiconductor substrate, and method of using same |
David L. Harmon, John F. Rembetski, Pai-Hung Pan |
1997-11-11 |
| 5298790 |
Reactive ion etching buffer mask |
David L. Harmon, Michael L. Kerbaugh, John F. Rembetski |
1994-03-29 |
| 5118384 |
Reactive ion etching buffer mask |
David L. Harmon, Michael L. Kerbaugh, John F. Rembetski |
1992-06-02 |
