| 12165933 |
Semiconductor substrate processing apparatus and semiconductor substrate measuring apparatus using the same |
Inkeun Baek, Suhwan Park, Junbum Park |
2024-12-10 |
| 11688623 |
Wafer inspection apparatuses |
Racine Elysia Auxter Nassau, Suhwan Park, Taeheung Ahn, Sangyeon OH |
2023-06-27 |
| 11680898 |
Hybrid probe, physical property analysis apparatus including the same, and method of measuring semiconductor device using the apparatus |
Junbum Park, Inkeun Baek, Jongmin YOON |
2023-06-20 |
| 11579168 |
Probe for detecting near field and near-field detecting system including the same |
Ikseon Jeon, Junbum Park, Inkeun Baek |
2023-02-14 |
| 11579167 |
Probe for detecting near field and near-field detection system including the same |
Jongmin YOON, Nagel Michael, Suhwan Park, Junbum Park, Inkeun Baek +1 more |
2023-02-14 |
| 10611937 |
Composition for adhesion, stacked structure using the same, and electronic device using the same |
Minchul Lee, Kyungrim KIM, Sun Woo Park, Yongin Park, Min-Woo Lee +4 more |
2020-04-07 |
| 8795775 |
Nanoimprint method |
Jung Wuk Kim, Christian Moormann |
2014-08-05 |
