Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422376 | Imaging reflectometry for inline screening | John Robinson, Stilian Ivanov Pandev, Shifang Li, Justin Lach, Barry Saville +5 more | 2025-09-23 |
| 7418124 | Qualifying patterns, patterning processes, or patterning apparatus in the fabrication of microlithographic patterns | Ingrid B. Peterson, Jim Wiley | 2008-08-26 |