| 7672803 |
Input of test conditions and output generation for built-in self test |
Darlene Hamilton, Ken Cheong Cheah |
2010-03-02 |
| 7415646 |
Page—EXE erase algorithm for flash memory |
Darlene Hamilton, Ken Cheong Cheah |
2008-08-19 |
| 7284167 |
Automated tests for built-in self test |
Darlene Hamilton, Ken Cheong Cheah, Kendra Nguyen, Xin Guo |
2007-10-16 |
| 6967873 |
Memory device and method using positive gate stress to recover overerased cell |
Darlene Hamilton, Zhizheng Liu, Mark Randolph, Yi He, Edward Hsia +2 more |
2005-11-22 |
| 6778442 |
Method of dual cell memory device operation for improved end-of-life read margin |
Darlene Hamilton, Edward Hsia, Kulachet Tanpairoj, Alykhan Madhani |
2004-08-17 |
| 6768673 |
Method of programming and reading a dual cell memory device |
Edward Hsia, Darlene Hamilton, Kulachet Tanpairoj, Alykhan Madhani, Yi He |
2004-07-27 |