MC

Min-Chih Chang

ET Etron Technology: 1 patents #75 of 145Top 55%
Overall (All Time): #3,114,373 of 4,157,543Top 75%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8773931 Method of detecting connection defects of memory and memory capable of detecting connection defects thereof Shih-Hsing Wang, Te-Yi Yu, Lien-Sheng Yang 2014-07-08