MN

Masaru Nakamichi

RE Renesas Electronics: 9 patents #397 of 4,529Top 9%
RT Renesas Technology: 8 patents #341 of 3,337Top 15%
HC Hitachi Ulsi Systems Co.: 7 patents #101 of 867Top 15%
MC Macronix International Co.: 1 patents #718 of 1,241Top 60%
Overall (All Time): #247,858 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
12408342 Memory device with multi-layered charge storage stack Chi-Pin Lu, Pei-Ci Jhang, Ling Yang, Kuang-Chao Chen 2025-09-02
9530485 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2016-12-27
9111636 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2015-08-18
8797791 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2014-08-05
8437179 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2013-05-07
8390048 Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Takeshi Sakai, Yasushi Ishii, Tsutomu Okazaki, Toshikazu Matsui, Kyoya Nitta +3 more 2013-03-05
8232589 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2012-07-31
8125017 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2012-02-28
7964484 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2011-06-21
7863135 Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Takeshi Sakai, Yasushi Ishii, Tsutomu Okazaki, Toshikazu Matsui, Kyoya Nitta +3 more 2011-01-04
7663176 Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Takeshi Sakai, Yasushi Ishii, Tsutomu Okazaki, Toshikazu Matsui, Kyoya Nitta +3 more 2010-02-16
7569881 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2009-08-04
7388238 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2008-06-17
7371631 Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Takeshi Sakai, Yasushi Ishii, Tsutomu Okazaki, Toshikazu Matsui, Kyoya Nitta +3 more 2008-05-13
7087942 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2006-08-08
7045864 Semiconductor integrated circuit device Kota Funayama, Yasuko Yoshida, Akio Nishida 2006-05-16
6998674 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2006-02-14
6885057 Semiconductor integrated circuit device with reduced leakage current Kenichi Osada, Koichiro Ishibashi, Yoshikazu Saitoh, Akio Nishida, Naoki Kitai 2005-04-26