Issued Patents All Time
Showing 1–25 of 115 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9391686 | Wireless communication system and data transmitter | Hidetoshi Ikeda, Haruya Ishizaki | 2016-07-12 |
| 9287968 | Wireless communication system and data transmitter | Hidetoshi Ikeda, Haruya Ishizaki | 2016-03-15 |
| 9183422 | Wireless communication system, wireless communication method, radio equipment, and data transmitter | Haruya Ishizaki | 2015-11-10 |
| 8891413 | Radio communication system, radio communication method, and data transmitter | Haruya Ishizaki | 2014-11-18 |
| 8862934 | Redundant computing system and redundant computing method | Yoshio Kameda | 2014-10-14 |
| 8674774 | Aging diagnostic device, aging diagnostic method | Eisuke Saneyoshi, Koichi Nose | 2014-03-18 |
| 8635040 | Signal measuring device and signal measuring method | Koichi Nose, Atsufumi Shibayama | 2014-01-21 |
| 8513970 | Semiconductor device and method of testing the same | Yoshio Kameda, Yoshihiro Nakagawa, Koichiro Noguchi, Koichi Nose | 2013-08-20 |
| 8444316 | Temperature measuring device and method | Eisuke Saneyoshi, Koichi Nose, Mikihiro Kajita | 2013-05-21 |
| 8446162 | Semiconductor integrated circuit device with test circuit and test method therefor | Koichi Nose | 2013-05-21 |
| 8441277 | Semiconductor testing device, semiconductor device, and testing method | Koichiro Noguchi, Yoshio Kameda, Koichi Nose, Toshinobu Ono | 2013-05-14 |
| 8429663 | Allocating task groups to processor cores based on number of task allocated per core, tolerable execution time, distance between cores, core coordinates, performance and disposition pattern | Masamichi Takagi, Hiroaki Inoue | 2013-04-23 |
| 8399960 | Semiconductor device | Yoshihiro Nakagawa, Koichiro Noguchi, Yoshio Kameda | 2013-03-19 |
| 8355884 | Signal quality measurement device, spectrum measurement circuit, and program | Koichi Nose | 2013-01-15 |
| 8330254 | Semiconductor device | Masayuki Furumiya, Hiroaki Ohkubo, Fuyuki Okamoto, Koichi Nose, Yoshihiro Nakagawa +1 more | 2012-12-11 |
| 8330483 | Semiconductor device to detect abnormal leakage current caused by a defect | — | 2012-12-11 |
| 8301936 | Apparatus and method for performing a screening test of semiconductor integrated circuits | Hiroaki Inoue, Masamichi Takagi | 2012-10-30 |
| 8242814 | Clock generating circuit and clock generating method | Koichi Nose, Atsufumi Shibayama | 2012-08-14 |
| 8243467 | Semiconductor device | Yoshihiro Nakagawa | 2012-08-14 |
| 8178974 | Microstrip structure including a signal line with a plurality of slit holes | — | 2012-05-15 |
| 8140912 | Semiconductor integrated circuits and method of detecting faults of processors | Hiroaki Inoue, Masamichi Takagi | 2012-03-20 |
| 8118591 | Heat shield plate for substrate annealing apparatus | Terumasa Ishihara, Takaharu Hashimoto, Masaru Morita | 2012-02-21 |
| 8115540 | Amplifying apparatus, method of output control and control program | Koichi Nose, Haruya Ishizaki | 2012-02-14 |
| 8115507 | Circuit and method for parallel testing and semiconductor device | — | 2012-02-14 |
| 8108719 | Information processing device and failure concealing method therefor | Hiroaki Inoue, Masamichi Takagi | 2012-01-31 |