Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9244946 | Data mining shape based data | Leah Pastel, Adam E. Trojanowski | 2016-01-26 |
| 9235601 | Data mining shape based data | Leah Pastel, Adam E. Trojanowski | 2016-01-12 |
| 8571299 | Identifying defects | Mohammed Fazil Fayaz, Julie L. Lee, Leah Pastel | 2013-10-29 |
| 8566059 | Insertion of faults in logic model used in simulation | Rao H. Desineni, Mary P. Kusko, Leah Pastel | 2013-10-22 |
| 8136082 | Method for testing integrated circuits | Rao H. Desineni, Franco Motika, Leah Pastel | 2012-03-13 |
| 7971176 | Method for testing integrated circuits | Rao H. Desineni, Franco Motika, Leah Pastel | 2011-06-28 |
| 7870519 | Method for determining features associated with fails of integrated circuits | Rao H. Desineni, Leah Pfeifer Pastel | 2011-01-11 |
| 7853848 | System and method for signature-based systematic condition detection and analysis | Rao H. Desineni, Leah Pastel | 2010-12-14 |
| 7752514 | Methods and apparatus for testing a scan chain to isolate defects | Leendert M. Huisman, William V. Huott, Franco Motika | 2010-07-06 |
| 7596736 | Iterative process for identifying systematics in data | Leah Pastel | 2009-09-29 |
| 7558999 | Learning based logic diagnosis | James W. Adkisson, John M. Cohn, Leendert M. Huisman, Leah Pfeifer Pastel, David E. Sweenor | 2009-07-07 |
| 7313744 | Methods and apparatus for testing a scan chain to isolate defects | Leendert M. Huisman, William V. Huott, Franco Motika | 2007-12-25 |
| 6880136 | Method to detect systematic defects in VLSI manufacturing | Leendert M. Huisman, Leah Pastel | 2005-04-12 |