Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8743702 | Test apparatus and test method | Shinichi Ishikawa, Hiroyasu Nakayama, Masaru Tsuto | 2014-06-03 |
| 8692566 | Test apparatus and test method | Shinichi Ishikawa, Hiroyasu Nakayama, Masaru Tsuto | 2014-04-08 |
| 8666691 | Test apparatus and test method | Shinichi Ishikawa, Tetsu Katagiri, Hiroyasu Nakayama, Masaru Tsuto | 2014-03-04 |
| 8483073 | Test apparatus and test method | Shinichi Ishikawa, Hiroyasu Nakayama, Masaru Tsuto | 2013-07-09 |
| 8418011 | Test module and test method | Tokunori Akita | 2013-04-09 |
| 8362791 | Test apparatus additional module and test method | Motoo Ueda, Satoshi Iwamoto, Hiroyasu Nakayama, Masaru Tsuto | 2013-01-29 |
| 8165027 | Test apparatus and test method | Shinichi Ishikawa, Hiroyasu Nakayama, Masaru Tsuto | 2012-04-24 |
| 8149721 | Test apparatus and test method | Shinichi Ishikawa, Hajime Sugimura, Hiroyasu Nakayama, Masaru Tsuto | 2012-04-03 |
| 8059547 | Test apparatus and test method | Hiroyasu Nakayama, Masaru Tsuto | 2011-11-15 |
| 7623984 | Test apparatus and electronic device | — | 2009-11-24 |
| 7539592 | Test apparatus and electronic device | — | 2009-05-26 |
| 7363566 | Pattern generator and test apparatus | — | 2008-04-22 |
| 7336714 | Phase adjustment apparatus and semiconductor test apparatus | — | 2008-02-26 |
| 7236903 | Test apparatus and control method | — | 2007-06-26 |
| 6249533 | Pattern generator | — | 2001-06-19 |
| 6061813 | Memory test set | — | 2000-05-09 |