Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12427604 | Processing method and processing apparatus for ingot | Asahi NOMOTO, Yujiro SUDO, Kazuya Hirata | 2025-09-30 |
| 12270790 | Inspection apparatus | Naoki MURAZAWA | 2025-04-08 |
| 11892282 | Protective film thickness measuring method | Hiroto Yoshida, Nobuyasu Kitahara, Kuo-Wei Wu, Naoki MURAZAWA, Joel Koerwer | 2024-02-06 |
| 10852240 | Facet region detecting method and detecting apparatus | Naoki MURAZAWA | 2020-12-01 |
| 10625371 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2020-04-21 |
| 10369659 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2019-08-06 |
| 10076804 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2018-09-18 |
| 9925619 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2018-03-27 |
| 9884390 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2018-02-06 |
| 9789565 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2017-10-17 |
| 9764428 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2017-09-19 |
| 9764420 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2017-09-19 |
| 9517530 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2016-12-13 |
| 9481051 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2016-11-01 |
| 9054179 | Wafer processing method | Chikara Aikawa, Nobuyasu Kitahara, Seiji Fujiwara, Yoshiaki Yodo, Junichi Kuki | 2015-06-09 |