Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12270790 | Inspection apparatus | Kunimitsu Takahashi | 2025-04-08 |
| 11892282 | Protective film thickness measuring method | Hiroto Yoshida, Nobuyasu Kitahara, Kuo-Wei Wu, Kunimitsu Takahashi, Joel Koerwer | 2024-02-06 |
| 11340163 | Method and apparatus for detecting facet region, wafer producing method, and laser processing apparatus | Yusaku Ito, Kazuya Hirata | 2022-05-24 |
| 11110549 | Recess or through-hole forming method and electrode forming method | Kazuma Sekiya | 2021-09-07 |
| 10852240 | Facet region detecting method and detecting apparatus | Kunimitsu Takahashi | 2020-12-01 |