Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12361531 | Machine learning-based classification of defects in a semiconductor specimen | Ohad Shaubi, Boaz Cohen, Ore SHTALRID | 2025-07-15 |
| 11151706 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Boaz Cohen | 2021-10-19 |
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Ohad Shaubi, Shiran Gan-Or, Boaz Cohen, Zeev Zohar | 2021-06-15 |
| 10921334 | System, method and computer program product for classifying defects | Assaf Asbag, Boaz Cohen | 2021-02-16 |