Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196673 | Defect inspection apparatus and defect inspection method | Takeru UTSUGI, Toshifumi Honda, Andreas Karsaklian Dal Bosco, Tomoto Kawamura | 2025-01-14 |
| 9535009 | Inspection system | Hidetoshi Nishiyama, Takahiro Jingu, Masaaki Ito | 2017-01-03 |