Issued Patents All Time
Showing 1–25 of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416566 | Automated spectroscopic analysis of micron-scale microplastic particles with optical photothermal infrared spectroscopy | Craig Prater, Eoghan Dillon, Andrew T. B. Stuart | 2025-09-16 |
| 12332168 | Method and apparatus for improved composite multi-wavelength photothermal infrared imaging | Craig Prater | 2025-06-17 |
| 12209950 | Method and apparatus for enhanced photo-thermal imaging and spectroscopy | Craig Prater, Roshan Shetty | 2025-01-28 |
| 11714103 | Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy | Craig Prater | 2023-08-01 |
| 11680892 | Method and apparatus for enhanced photo-thermal imaging and spectroscopy | Craig Prater, Roshan Shetty | 2023-06-20 |
| 11226285 | Surface sensitive atomic force microscope based infrared spectroscopy | Craig Prater | 2022-01-18 |
| 11002665 | Method and apparatus for enhanced photo-thermal imaging and spectroscopy | Craig Prater, Roshan Shetty | 2021-05-11 |
| 10969405 | Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniques | Roshan Shetty, Craig Prater | 2021-04-06 |
| 10942116 | Method and apparatus for enhanced photo-thermal imaging and spectroscopy | Craig Prater, Roshan Shetty | 2021-03-09 |
| 10914755 | Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy | Craig Prater | 2021-02-09 |
| 10557789 | Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy | Craig Prater, Doug Gotthard, Qichi Hu | 2020-02-11 |
| 10228388 | Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy | Craig Prater | 2019-03-12 |
| 10082523 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Honghua Yang, Sam Berweger, Craig Prater | 2018-09-25 |
| 9778282 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Honghua Yang, Sam Berweger, Craig Prater | 2017-10-03 |
| 9658247 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Honghua Yang, Sam Berweger, Craig Prater | 2017-05-23 |
| 9134341 | Multiple modulation heterodyne infrared spectroscopy | Craig Prater | 2015-09-15 |
| 8869602 | High frequency deflection measurement of IR absorption | Mikhail A. Belkin, Feng Lu, Vladislav V. Yakolev, Craig Prater, Markus B. Raschke | 2014-10-28 |
| 8857247 | Probe for a scanning probe microscope and method of manufacture | Ami Chand, Nihat Okulan | 2014-10-14 |
| 8680467 | High frequency deflection measurement of IR absorption with a modulated IR source | Craig Prater | 2014-03-25 |
| 8646319 | Dynamic power control for nanoscale spectroscopy | Craig Prater | 2014-02-11 |
| 8607622 | High frequency deflection measurement of IR absorption | Alexandre Dazzi, Rui Prazeres, Michael Reading | 2013-12-17 |
| 8418538 | High frequency deflection measurement of IR absorption | A. Dazzi Dazzi, Clotilde Policar, Michael Reading, Konstantin Vodopyanov, Craig Prater | 2013-04-16 |
| 8402819 | High frequency deflection measurement of IR absorption | A. Dazzi Dazzi, Clotilde Policar, Michael Reading, Konstantin Vodopyanov, Craig Prater | 2013-03-26 |
| 8387443 | Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer | William P. King, Jonathan R. Felts, Craig Prater | 2013-03-05 |
| 8242448 | Dynamic power control, beam alignment and focus for nanoscale spectroscopy | Craig Prater, Michael Hawjing Lo, Doug Gotthard, Anthony D. Kurtz | 2012-08-14 |