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Charge trap evaluation method and semiconductor element |
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Method for evaluating electrical defect density of semiconductor layer, and semiconductor element |
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Photon counting-type radiation detector and radiological inspection device using same |
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Semiconductor device |
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2016-05-17 |
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Drawing management device having ability to retrieve and display a desired amount of data within a desired display time |
Manabu Fukushima, Mikio Yoda |
2011-05-31 |
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Semiconductor device and method for fabricating the same |
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Figure management system and figure modifying method by using figure management system |
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2004-04-27 |
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Method of managing feature data |
Keiro Muro, Kazuaki Iwamura, Yasuei Nomoto |
2003-01-07 |
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Trackingless high-speed optical readout method by planar apertured probe array |
Motonobu Korogi, Motoichi Otsu |
2000-08-08 |
| 5454073 |
Drawing management device having ability to retrieve and display a desired amount of data within a desired display time |
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1995-09-26 |