Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11652150 | Charge trap evaluation method and semiconductor element | Kuniyuki Kakushima, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Taiki YAMAMOTO | 2023-05-16 |
| 11513149 | Method for evaluating electrical defect density of semiconductor layer, and semiconductor element | Kuniyuki Kakushima, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Taiki YAMAMOTO | 2022-11-29 |