Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9053821 | Semiconductor device performing stress test | Yoshiro Riho, Hiromasa Noda | 2015-06-09 |
| 8737149 | Semiconductor device performing stress test | Yoshiro Riho, Hiromasa Noda | 2014-05-27 |
| 7227251 | Semiconductor device and a memory system including a plurality of IC chips in a common package | Masayasu Kawamura, Yasushi Takahashi, Masachika Masuda, Tamaki Wada, Michiaki Sugiyama +2 more | 2007-06-05 |
| 6885092 | Semiconductor device and a memory system including a plurality of IC chips in a common package | Masayasu Kawamura, Yasushi Takahashi, Masachika Masuda, Tamaki Wada, Michiaki Sugiyama +2 more | 2005-04-26 |