JY

Junyje Yeh

AS Aehr Test Systems: 3 patents #23 of 36Top 65%
Overall (All Time): #1,472,630 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
9880197 Controlling alignment during a thermal cycle Scott E. Lindsey, Jovan Jovanovic, Seang P. Malathong 2018-01-30
8947116 System for testing an integrated circuit of a device and its method of use Scott E. Lindsey, Jovan Jovanovic, Seang P. Malathong 2015-02-03
8030957 System for testing an integrated circuit of a device and its method of use Scott E. Lindsey, Jovan Jovanovic, Seang P. Malathong 2011-10-04