JR

John-Pierre Rey

KL Kla-Tencor: 1 patents #316 of 626Top 55%
📍 Fontenay-aux-Roses, FR: #108 of 220 inventorsTop 50%
Overall (All Time): #3,478,808 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6734967 Focused beam spectroscopic ellipsometry method and system Timothy R. Piwonka-Corle, Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle +1 more 2004-05-11