| 7474105 |
Soil moisture sensor systems and methods |
— |
2009-01-06 |
| 7324901 |
Water measurement auto-networks |
— |
2008-01-29 |
| 6925398 |
Water measurement apparatus and methods |
— |
2005-08-02 |
| 6876214 |
Method and apparatus for configurable hardware augmented program generation |
David T. Crook |
2005-04-05 |
| 6636061 |
Method and apparatus for configurable hardware augmented program generation |
David T. Crook |
2003-10-21 |
| 6529019 |
Multiple axis magnetic test for open integrated circuit pins |
Philip N. King, David T. Crook |
2003-03-04 |
| 6467051 |
Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test |
Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie, Kay C. Lannen |
2002-10-15 |
| 6334100 |
Method and apparatus for electronic circuit model correction |
Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, Kay C. Lannen, Jamie P. Romero |
2001-12-25 |
| 6327545 |
Method and apparatus for board model correction |
Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie |
2001-12-04 |
| 6266787 |
Method and apparatus for selecting stimulus locations during limited access circuit test |
Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, Kay C. Lannen |
2001-07-24 |
| 6263476 |
Method and apparatus for selecting targeted components in limited access test |
Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie, Kay C. Lannen |
2001-07-17 |
| 6237118 |
Method and apparatus for correcting for detector inaccuracies in limited access testing |
Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie |
2001-05-22 |
| 6233706 |
Method and apparatus for limited access circuit test |
Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, Kay C. Lannen |
2001-05-15 |
| 6097203 |
Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry |
Kenneth P. Parker |
2000-08-01 |
| 6087842 |
Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry |
Kenneth P. Parker |
2000-07-11 |
| 5968191 |
Method and apparatus for testing integrated circuits in a mixed-signal environment |
Carl Wilmer Thatcher, Stig Oresjo, Kenneth P. Parker |
1999-10-19 |
| 5469064 |
Electrical assembly testing using robotic positioning of probes |
Ronald K. Kerschner, John M. Heumann, Ed. O. Schlotzhauer, David T. Crook |
1995-11-21 |
| 5274336 |
Capacitively-coupled test probe |
David T. Crook, John M. Heumann, Ronald J. Peiffer, Ed O. Schlotzhauer |
1993-12-28 |
| 4563636 |
Connection verification between circuit board and circuit tester |
Matthew L. Snook, William Nicolay |
1986-01-07 |
