Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7411383 | Method and apparatus for discharging voltages from a circuit under test | Dayton Norrgard, Kevin Wible | 2008-08-12 |
| 7307222 | Printed circuit board test access point structures and method for making the same | Kenneth P. Parker, Glen E. Leinbach | 2007-12-11 |
| 7132834 | Capacitive sensor measurement method for discrete time sampled system for in-circuit test | Curtis Tesdahl | 2006-11-07 |
| 7132876 | System for discharging electronic circuitry | Kevin Wible | 2006-11-07 |
| 7061250 | Capacitive sensor measurement method for discrete time sampled system for in-circuit test | Curtis Tesdahl | 2006-06-13 |
| 6998849 | Capacitive sensor measurement method for discrete time sampled system for in-circuit test | Curtis Tesdahl | 2006-02-14 |
| 5760596 | Testing series passive components without contacting the driven node | Kenneth P. Parker | 1998-06-02 |
| 5489851 | Identification of pin-open faults by measuring current or voltage change resulting from temperature change | John M. Heumann | 1996-02-06 |
| 5392001 | Capacitively-coupled amplifier with improved low frequency response | Thomas F. Uhling, John M. Heumann | 1995-02-21 |
| 5274336 | Capacitively-coupled test probe | David T. Crook, John M. Heumann, John E. McDermid, Ed O. Schlotzhauer | 1993-12-28 |
| 5101152 | Integrated circuit transfer test device system utilizing lateral transistors | Vance R. Harwood, Kevin W. Keirn, John J. Keller | 1992-03-31 |
| 4801878 | In-circuit transistor beta test and method | David T. Crook | 1989-01-31 |