Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5696451 | Identification of pin-open faults by capacitive coupling | David T. Crook | 1997-12-09 |
| 5625292 | System for measuring the integrity of an electrical contact | David T. Crook, Ugur Cilingiroglu | 1997-04-29 |
| 5557209 | Identification of pin-open faults by capacitive coupling through the integrated circuit package | David T. Crook, Ugur Cilingiroglu | 1996-09-17 |
| 5254953 | Identification of pin-open faults by capacitive coupling through the integrated circuit package | David T. Crook, Ugur Cilingiroglu | 1993-10-19 |
| 5101152 | Integrated circuit transfer test device system utilizing lateral transistors | Vance R. Harwood, John J. Keller, Ronald J. Peiffer | 1992-03-31 |
| 5001418 | Method for compressing data-vectors for a circuit board testing machine | Kenneth E. Posse, Michael A. Lassner, George L. Booth | 1991-03-19 |