Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7518384 | Method and apparatus for manufacturing and probing test probe access structures on vias | Glen E. Leinbach | 2009-04-14 |
| 7504589 | Method and apparatus for manufacturing and probing printed circuit board test access point structures | Chris R. Jacobsen | 2009-03-17 |
| 7437638 | Boundary-Scan methods and apparatus | — | 2008-10-14 |
| 7362106 | Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes | Myron J. Schneider | 2008-04-22 |
| 7325219 | Method and apparatus for determining probing locations for a printed circuit board | Chris R. Jacobsen | 2008-01-29 |
| 7307427 | Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards | Chris R. Jacobsen, Myron J. Schneider, Tak Yee Kwan | 2007-12-11 |
| 7307426 | Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices | Chris R. Jacobsen | 2007-12-11 |
| 7307222 | Printed circuit board test access point structures and method for making the same | Ronald J. Peiffer, Glen E. Leinbach | 2007-12-11 |
| 7295031 | Method for non-contact testing of marginal integrated circuit connections | Chris R. Jacobsen, Dayton Norrgard, Myron J. Schneider | 2007-11-13 |
| 7259576 | Method and apparatus for a twisting fixture probe for probing test access point structures | Chris R. Jacobsen | 2007-08-21 |
| 7224169 | Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections | — | 2007-05-29 |
| 7208957 | Method for non-contact testing of fixed and inaccessible connections without using a sensor plate | Myron J. Schneider, Chris R. Jacobsen | 2007-04-24 |
| 7190157 | Method and apparatus for layout independent test point placement on a printed circuit board | — | 2007-03-13 |
| 7187165 | Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture build | Chris R. Jacobsen, John E. Herczeg | 2007-03-06 |
| 7170298 | Methods for testing continuity of electrical paths through connectors of circuit assemblies | Jacob L. Bell | 2007-01-30 |
| 7161369 | Method and apparatus for a wobble fixture probe for probing test access point structures | Richard Rivas | 2007-01-09 |
| 7137052 | Methods and apparatus for minimizing current surges during integrated circuit testing | — | 2006-11-14 |
| 7123022 | Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assemblies | Chris R. Jacobsen, Myron J. Schneider | 2006-10-17 |
| 7068039 | Test structure embedded in a shipping and handling cover for integrated circuit sockets and method for testing integrated circuit sockets and circuit assemblies utilizing same | — | 2006-06-27 |
| 6960917 | Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies | Nurwati Devnani | 2005-11-01 |
| 6948140 | Methods and apparatus for characterizing board test coverage | Kathleen J. Hird, Erik A. Ramos | 2005-09-20 |
| 6933730 | Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies | Jacob L. Bell | 2005-08-23 |
| 6895565 | Methods for predicting board test coverage | — | 2005-05-17 |
| 6792385 | Methods and apparatus for characterizing board test coverage | Kathleen J. Hird, Erik A. Ramos | 2004-09-14 |
| 6763486 | Method and apparatus of boundary scan testing for AC-coupled differential data paths | Benny Wing Hung Lai, Young Gon Kim, Jeff Rearick | 2004-07-13 |