Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6744256 | Boundary-scan testing of opto-electronic devices | Myunghee Lee | 2004-06-01 |
| 6452410 | Apparatus and method for electrolytic bare board testing | — | 2002-09-17 |
| 6389565 | Mechanism and display for boundary-scan debugging information | Heather M. Ryan, Robert Mayrus Tromp | 2002-05-14 |
| 6243843 | Post-mission test method for checking the integrity of a boundary scan test | Stig Oresjo | 2001-06-05 |
| 6243853 | Development of automated digital libraries for in-circuit testing of printed curcuit boards | — | 2001-06-05 |
| 6097203 | Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry | John E. McDermid | 2000-08-01 |
| 6087842 | Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry | John E. McDermid | 2000-07-11 |
| 5968191 | Method and apparatus for testing integrated circuits in a mixed-signal environment | Carl Wilmer Thatcher, Stig Oresjo, John E. McDermid | 1999-10-19 |
| 5760596 | Testing series passive components without contacting the driven node | Ronald J. Peiffer | 1998-06-02 |
| 5751737 | Boundary scan testing device | Joseph M. Lagrotta, James Loye Hutchinson, Daniel G. Bihn, David J. Rustici, Keisuke Takaura +3 more | 1998-05-12 |
| 5513188 | Enhanced interconnect testing through utilization of board topology data | Kenneth E. Posse | 1996-04-30 |
| 5510704 | Powered testing of mixed conventional/boundary-scan logic | Kenneth E. Posse | 1996-04-23 |
| 5448166 | Powered testing of mixed conventional/boundary-scan logic | Kenneth E. Posse | 1995-09-05 |
| 5402427 | Circuit tester with coincident sequencing of independently compressed test data matrix segments | — | 1995-03-28 |
| 5387862 | Powered testing of mixed conventional/boundary-scan logic | Kenneth E. Posse | 1995-02-07 |
| 5270642 | Partitioned boundary-scan testing for the reduction of testing-induced damage | — | 1993-12-14 |
| 5260649 | Powered testing of mixed conventional/boundary-scan logic | Kenneth E. Posse | 1993-11-09 |