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John E. McDermid — 19 Patents

ATAgilent Technologies: 12 patents #128 of 3,411Top 4%
HP: 4 patents #4,645 of 7,018Top 70%
CVColorado Vnet: 3 patents #4 of 12Top 35%
Ford: 1 patents #9,400 of 17,473Top 55%
Loveland, CO: #44 of 931 inventorsTop 5%
Colorado: #2,106 of 40,980 inventorsTop 6%
Overall (All Time): #229,345 of 4,157,543Top 6%
19 Patents All Time
John E. McDermid has been granted 19 US patents while listed as an inventor at Agilent Technologies. The first was granted in 1986 and the most recent in January 2009. John E. McDermid ranks #229,345 of 4,157,543 US inventors in our database (top 5.5%). Patent records list John E. McDermid in Loveland, CO, US.

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7474105 Soil moisture sensor systems and methods — 2009-01-06
7324901 Water measurement auto-networks — 2008-01-29
6925398 Water measurement apparatus and methods — 2005-08-02
6876214 Method and apparatus for configurable hardware augmented program generation David T. Crook 2005-04-05 $4,841,000
6636061 Method and apparatus for configurable hardware augmented program generation David T. Crook 2003-10-21 $25,275,000
6529019 Multiple axis magnetic test for open integrated circuit pins Philip N. King, David T. Crook 2003-03-04 $27,638,000
6467051 Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie, Kay C. Lannen 2002-10-15 $18,585,000
6334100 Method and apparatus for electronic circuit model correction Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, Kay C. Lannen, Jamie P. Romero 2001-12-25
6327545 Method and apparatus for board model correction Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie 2001-12-04 $16,485,000
6266787 Method and apparatus for selecting stimulus locations during limited access circuit test Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, Kay C. Lannen 2001-07-24 $23,567,000
6263476 Method and apparatus for selecting targeted components in limited access test Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie, Kay C. Lannen 2001-07-17 $23,762,000
6237118 Method and apparatus for correcting for detector inaccuracies in limited access testing Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie 2001-05-22 $53,735,000
6233706 Method and apparatus for limited access circuit test Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, Kay C. Lannen 2001-05-15 $67,204,000
6097203 Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry Kenneth P. Parker 2000-08-01 $121,173,000
6087842 Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry Kenneth P. Parker 2000-07-11 $134,421,000
5968191 Method and apparatus for testing integrated circuits in a mixed-signal environment Carl Wilmer Thatcher, Stig Oresjo, Kenneth P. Parker 1999-10-19
5469064 Electrical assembly testing using robotic positioning of probes Ronald K. Kerschner, John M. Heumann, Ed. O. Schlotzhauer, David T. Crook 1995-11-21 $33,821,000
5274336 Capacitively-coupled test probe David T. Crook, John M. Heumann, Ronald J. Peiffer, Ed O. Schlotzhauer 1993-12-28 $15,107,000
4563636 Connection verification between circuit board and circuit tester Matthew L. Snook, William Nicolay 1986-01-07 $30,792,000

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