Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6467051 | Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test | Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie, John E. McDermid | 2002-10-15 |
| 6334100 | Method and apparatus for electronic circuit model correction | Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, John E. McDermid, Jamie P. Romero | 2001-12-25 |
| 6266787 | Method and apparatus for selecting stimulus locations during limited access circuit test | John E. McDermid, Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie | 2001-07-24 |
| 6263476 | Method and apparatus for selecting targeted components in limited access test | Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie, John E. McDermid | 2001-07-17 |
| 6233706 | Method and apparatus for limited access circuit test | Cherif Ahrikencheikh, Rodney A. Browen, William P. Darbie, John E. McDermid | 2001-05-15 |
| 5581463 | Pay-per-use access to multiple electronic test capabilities and tester resources | Amanda L. Constant, David W. Webb, Sharon E. LaTourrette, Jeffrey C. Myers, Katherine Z. Withers-Miklos +2 more | 1996-12-03 |
| 5481463 | Pay-per-use access to multiple electronic test capabilities | Amanda L. Constant, David W. Webb, Katherine Z. Withers-Miklos, Ted T. Turner, Amos H. Leong | 1996-01-02 |
| 5412575 | Pay-per-use access to multiple electronic test capabilities | Amanda L. Constant, David W. Webb, Katherine Z. Withers-Miklos, Ted T. Turner, Amos Hong-Kiat Leong | 1995-05-02 |
| 5262716 | Tester calibration procedure which includes fixturing | Walter L. Gregory, Jr., Jay M. Stepleton, Davis M. Glasgow | 1993-11-16 |