| 10195715 |
Chemical mechanical polishing machine and polishing head assembly |
In Kwon Kim, Kyung-Hyun Kim, Ki-Jong Park, Ki-ho Bae |
2019-02-05 |
| 9997534 |
Vertical memory devices |
Yong-Hoon Son, Kyung-Hyun Kim, Byeong Ju Kim, Phil Ouk Nam, Kwang-Chul Park +4 more |
2018-06-12 |
| 9893077 |
Memory device and method of manufacturing the same |
Phil Ouk Nam, Yong-Hoon Son, Kyung-Hyun Kim, Byeong Ju Kim, Kwang-Chul Park +3 more |
2018-02-13 |
| 9502332 |
Nonvolatile memory device and a method for fabricating the same |
Hyo Jung Kim, Ji Woon Im, Kyung-Hyun Kim |
2016-11-22 |
| 9254546 |
Chemical mechanical polishing machine and polishing head assembly |
In Kwon Kim, Kyung-Hyun Kim, Ki-Jong Park, Ki-ho Bae |
2016-02-09 |
| 8912592 |
Non-volatile memory device including etch stop layer pattern |
Ki-ho Bae, Hyo Jung Kim, Kyung-Hyun Kim, Chan-wook Seo, Young Beom Pyon |
2014-12-16 |
| 8822287 |
Methods of manufacturing semiconductor devices |
Hyo Jung Kim, Ki-Hyun Hwang, Kyung-Hyun Kim, Han-Mei Choi, Dong-Chul Yoo +4 more |
2014-09-02 |
| 8664101 |
Multiple mold structure methods of manufacturing vertical memory devices |
Hyo Jung Kim, Dae-Hong Eom, Myung-Jung Pyo, Byoung-Moon Yoon, Kyung-Hyun Kim |
2014-03-04 |
| 8283248 |
Methods of manufacturing semiconductor devices |
Tae Hyun Kim, Kyung-Hyun Kim, Jae-Hwang Sim, Jae-Jin Shin, Hyun Min Park |
2012-10-09 |
| 8038508 |
Apparatus for polishing a wafer and method for detecting a polishing end point by the same |
Sung-Ho Shin, Bo-Un Yoon, Chang-Ki Hong |
2011-10-18 |
| 8008172 |
Methods of forming semiconductor devices including multistage planarization and crystalization of a semiconductor layer |
Chang-Ki Hong, Bo-Un Yoon, Seong-Kyu Yun, Suk-Hun Choi, Sang-Yeob Han |
2011-08-30 |
| 7932163 |
Methods of forming stacked semiconductor devices with single-crystal semiconductor regions |
Chang-Ki Hong, Bo-Un Yoon, Dae-Lok Bae, Seong-Kyu Yun, Suk-Hun Choi |
2011-04-26 |
| 7678625 |
Methods of fabricating semiconductor devices including channel layers having improved defect density and surface roughness characteristics |
Chang-Ki Hong, Bo-Un Yoon, Seong-Kyu Yun, Suk-Hun Choi, Sang-Yeob Han |
2010-03-16 |
