Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10885253 | System and method for determining dimensional range of repairable defects by deposition and etching in a virtual fabrication environment | Daniel N. Sobieski, Rich Wise, Yang Pan, David M. Fried | 2021-01-05 |