Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7968859 | Wafer edge defect inspection using captured image analysis | Roger Y. B. Young, John A. Knoch | 2011-06-28 |
| 7315360 | Surface coordinate system | Bruce Whitefield | 2008-01-01 |
| 7312880 | Wafer edge structure measurement method | Bruce Whitefield, David J. Sturtevant | 2007-12-25 |