Issued Patents All Time
Showing 1–25 of 68 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11715615 | Light modulated electron source | Edgardo Garcia Berrios, Yinying Xiao-Li, John Fielden, Yung-Ho Alex Chuang | 2023-08-01 |
| 11417492 | Light modulated electron source | Edgardo Garcia Berrios, Yinying Xiao-Li, John Fielden, Yung-Ho Alex Chuang | 2022-08-16 |
| 10439355 | 193nm laser and inspection system | Yung-Ho Alex Chuang, Yujun Deng, Justin Dianhuan Liou, Vladimir Dribinski, John Fielden | 2019-10-08 |
| 10199149 | 183NM laser and inspection system | Yung-Ho Alex Chuang, Yujun Deng, Vladimir Dribinski, John Fielden, Jidong Zhang | 2019-02-05 |
| 10193293 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Vladimir Dribinski, David L. Brown | 2019-01-29 |
| 10044164 | Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms | Yung-Ho Alex Chuang, Xiaoxu Lu, Justin Dianhuan Liou, Yujun Deng, John Fielden | 2018-08-07 |
| 9972959 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Vladimir Dribinski, David L. Brown | 2018-05-15 |
| 9935421 | 193nm laser and inspection system | Yung-Ho Alex Chuang, Yujun Deng, Justin Dianhuan Liou, Vladimir Dribinski, John Fielden | 2018-04-03 |
| 9793673 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Vladimir Dribinski, David L. Brown | 2017-10-17 |
| 9768577 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Yujun Deng | 2017-09-19 |
| 9753352 | High damage threshold frequency conversion system | — | 2017-09-05 |
| 9748729 | 183NM laser and inspection system | Yung-Ho Alex Chuang, Yujun Deng, Vladimir Dribinski, John Fielden, Jidong Zhang | 2017-08-29 |
| 9608399 | 193 nm laser and an inspection system using a 193 nm laser | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Vladimir Dribinski, John Fielden | 2017-03-28 |
| 9529182 | 193nm laser and inspection system | Yung-Ho Alex Chuang, Yujun Deng, Justin Dianhuan Liou, Vladimir Dribinski, John Fielden | 2016-12-27 |
| 9525265 | Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms | Yung-Ho Alex Chuang, Xiaoxu Lu, Justin Dianhuan Liou, Yujun Deng, John Fielden | 2016-12-20 |
| 9477041 | Low stray light beam dump with fiber delivery | — | 2016-10-25 |
| 9419407 | Laser assembly and inspection system using monolithic bandwidth narrowing apparatus | Yujun Deng, Yung-Ho Alex Chuang, Vladimir Dribinski, John Fielden | 2016-08-16 |
| 9413134 | Multi-stage ramp-up annealing for frequency-conversion crystals | Vladimir Dribinski, Yung-Ho Alex Chuang | 2016-08-09 |
| 9377610 | External beam delivery system for laser dark-field illumination in a catadioptric optical system | — | 2016-06-28 |
| 9318869 | 193nm laser and inspection system | Yung-Ho Alex Chuang, Vladimir Dribinski, Yujun Deng, John Fielden | 2016-04-19 |
| 9209589 | Reducing the spectral bandwidth of lasers | — | 2015-12-08 |
| 9152008 | High damage threshold frequency conversion system | — | 2015-10-06 |
| 9151940 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Yujun Deng | 2015-10-06 |
| 9097683 | Laser with high quality, stable output beam, and long life high conversion efficiency non-linear crystal | Vladimir Dribinski, Yung-Ho Alex Chuang, John Fielden | 2015-08-04 |
| 9042006 | Solid state illumination source and inspection system | — | 2015-05-26 |